XYZ Adhesion Testing 3

Test Setup

• 3-axis XYZ stage.
• Control loop at 1kHz embedded on Microchip PIC18F4431?
• Control done using trajectory files with waypoints and linear interpolation
• Sampling force plate at 1kHz.
  • Data filtered at 10 Hz using 3rd order Butterworth filter
• Sampling position data at 500Hz
• Fixed bug with missing encoder ticks
• Increased maximum test length from 65.535 seconds to 2^24 ms

Experiment #1

Procedure

• Preload along 45 degree approach angle to a specified depth in Z (400um, 500um, 600um)
• Pulloff along 30 degrees in YZ plane with curvature of stalks
• Pulloff measured by finding maximum value of V-dot-F in sampled force data
• Vary speed of tests - 0.01mm/s, 0.02mm/s, 0.05mm/s, 0.1mm/s, 0.2mm/s, 0.5mm/s, 1.0mm/s, 2.0mm/s, 5.0mm/s, 10.0mm/s

Materials

• Sample - Directional Adhesive Pad, #4A
• Substrate - Glass

Results

Experiment #2

Procedure

• Preload along 45 degree approach angle to a specified depth in Z (400um, 500um, 600um)
• Pulloff at specified angle defined by:
  • +Z is the contact normal, +Y is aligned against the "direction of curvature" of the samples, +X to enforce right-handedness
  • Begin with vector, V, aligned along +Z-axis
  • Rotate V about +X-axis by angle Theta, between 0 and 90 (and 95, 100, 105, 110, 115, 120) degrees in 15 degree increments
  • Rotate V about +Z-axis by angle Phi, between 0 and 345 degrees in 15 degree increments
  • Pull-off along vector V
• Pulloff measured by finding maximum value of V-dot-F in sampled force data

Materials

• Sample - Directional Adhesive Pad, #4A
• Substrate - Glass

Results